MATERIALS
FAILURE ANALYSIS
The great depth of field, the wide range of magnifications and determination of material elemental composition makes scanning electron microscopy tool of choice for identifying causes of failures (corrosion, fracture, surface colouring , surface defects - stripes , holes,…).
MATERIAL CHARACTERISATION
Our analytical method allows on one hand the determination of the elemental composition of the material, on the other hand the size of the microscopic objects. Our microscope, equipped with the MEX-software, is able to reconstruct a three-dimensional surface.
SURFACE ANALYSIS
In addition to scanning electron microscopy, surface analyses can be performed by other methods, such as SIMS, TOF-SIMS, XPS and Auger. These techniques provide information on the initial atomic layers of a surface.
